Reliability optimization method for embedded electronic information system

BAI Xin,LÜ Li-ping,WEI Lin

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Journal of Shenyang University of Technology ›› 2017, Vol. 39 ›› Issue (4) : 417-421. DOI: 10.7688/j.issn.1000-1646.2017.04.11

Reliability optimization method for embedded electronic information system

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2017, 39(4): 417-421 https://doi.org/10.7688/j.issn.1000-1646.2017.04.11

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