Gate tunneling current analysis model for scaled devices

WU Tiefeng;ZHANG Heming

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PDF(735 KB)
Journal of Shenyang University of Technology ›› 2010, Vol. 32 ›› Issue (5) : 569-573.
信息科学与工程

Gate tunneling current analysis model for scaled devices

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2010, 32(5): 569-573

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